The new NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor at the core of the semiconductor industry

At the center of stakes, we have: hardware and software features needed for smarter semiconductor test system development, we have: engineers and scientists , engineering challenges, device manufacturers and test houses lower the cost of test, throughput for RF and analog-centric ICs, to name a few.

In effect, the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor aims to free manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE). 

The NI digital pattern instrument is a software-centric instrument used by semiconductor characterization and production test engineers to drive down their cost of test and ensure product quality.